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XEI Scientific Granted Patent for TEM Vacuum Sample Loader

Analytik Jena's contrAA Series Provides AAS Users with Significantly More Information

Analytik Jena's contrAA Series Provides AAS Users with Significantly More Information

Michell Instruments' XTC601 Binary Gas Analyzer for Fine Control of Hydrogen in Heat Treatment Furnaces

Michell Instruments' XTC601 Binary Gas Analyzer for Fine Control of Hydrogen in Heat Treatment Furnaces

AB SCIEX Debuts Five New Mass Spectrometry Solutions at ASMS 2014

AB SCIEX Debuts Five New Mass Spectrometry Solutions at ASMS 2014

Bruker Announces Installation of 21 Tesla Magnet for FT-ICR Mass Spectrometry at NHMFL

Bruker Announces Installation of 21 Tesla Magnet for FT-ICR Mass Spectrometry at NHMFL

Brooks Instrument will Present its Industry Leading Mass Flow Control Technology at SEMICON West 2014

Brooks Instrument will Present its Industry Leading Mass Flow Control Technology at SEMICON West 2014

USPTO Allows 1st Detect Patent for Ion Trap Control for Chemical Analysis and Detection

USPTO Allows 1st Detect Patent for Ion Trap Control for Chemical Analysis and Detection

PANalytical Announces Free Webinar on July 10th, Covering Qualitative XRPD with HighScore Software

PANalytical Offer Free Webinar on Partial Least-Squares Regression (PLSR) for Industrial XRD Applications

PANalytical Offer Free Webinar on Partial Least-Squares Regression (PLSR) for Industrial XRD Applications

PicoQuant's New Upgrade to Their Confocal Microscopy System Goes Beyond the Diffraction Limit using STED

PicoQuant's New Upgrade to Their Confocal Microscopy System Goes Beyond the Diffraction Limit using STED

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