A new microscope that views the subatomic universe -- the first of its kind in the world -- is being built for the University of Victoria, Canada, in collaboration with Hitachi High-Technologies.
The new microscope-c...
Applied Materials, Inc. today announced that its Applied SEMVision™ G4 Defect Analysis platform has been honored with the prestigious Editors' Choice Best Product Award by Semiconductor International (SI) magazine.
The explosion in the number of new fluorescent dyes has opened up exciting new opportunities for life science researchers. However, each requires the microscope system to be equipped with an appropriate excitation laser, a limitation that has greatly restricted their adoption.
Fatigue in railway infrastructure from Woodhead Publishing provides a concise overview of fatigue in the railway industry from tracks and fixings to bridges and walk ways. After an opening chapter providing an overview of fatigue in railways the book goes on to focus on fatigue in railway and tramway track. Causes of potential failure are examined in such areas as rails and sleepers as well as rail fixings.
The leading event for the microelectronics failure analysis community returns to San Jose to help engineers and technicians identify defects that are costing manufacturers millions of dollars in failed components, repair...
Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices...
Semilab SSM, a division of Semilab, one of the world's largest metrology companies, announced at Semicon West today a new member of its NanoSRP family of metrology products. Designed for small and mid-tier sized semi...
Nanometrics Incorporated (Nasdaq: NANO), a leader in the design, manufacture and marketing of high-performance process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics ...
KLA-Tencor Corporation, the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, announced two new wafer inspection systems and a new electron-beam review system to address defect issues at the 3Xnm / 2Xnm nodes.
TEMwindows.com is celebrating its six-month business anniversary by launching new products, exhibiting at the Microscopy and Microanalysis 2009 conference, and increasing its reach through three new distributor partnersh...
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