Materials Testing News

RSS

New Grade of High-Purity Laboratory Acids Optimized for Trace Metal Analysis from Avantor

Avantor™ Performance Materials, a global manufacturer of performance materials and chemicals, has launched a new grade of high-purity laboratory acids optimized for trace metal analysis and designed to meet the needs of customers in environmental, food, quality control and other testing applications.

9 Jul 2014

New Magnum V Scalable Solution for Massively Parallel Memory Testing

Teradyne, Inc. announces the Magnum V, the next generation memory test solution in the Nextest Magnum product line designed for massively parallel memory test in the Flash, DRAM and multi chip package (MCP) marketplace.

8 Jul 2014

SEMICON West: FormFactor to Discuss Newest Wafer Test Technologies

At SEMICON West this week in San Francisco, executives from FormFactor, Inc. will discuss the company's newest wafer test technologies at a series of events and forums. SEMICON West is the premier annual conference and tradeshow for the global semiconductor manufacturing industry.

8 Jul 2014

Jordan Valley Semiconductors Adds Another Customer in Advanced Wafer Level Packaging

Jordan Valley Semiconductors Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that its micro-spot X-ray Fluorescence (µXRF) metrology tool has been qualified for production monitoring of advanced Wafer Level Packaging (WLP) processes, by another leading memory player.

4 Jul 2014

Hannibal Completes Comparative Impact Testing of TubeRack

Today, Hannibal Industries Inc. announced that it successfully conducted, completed and recorded the first-ever, side-by-side comparison between standard structural rack and patent-pending TubeRack.

2 Jul 2014

Agilent Introduces Inductively Coupled Plasma – Optical Emission Spectrometer

Agilent Technologies, Inc. today reinforced its position as an innovator in atomic spectroscopy with the introduction of the Agilent 5100 Inductively Coupled Plasma – Optical Emission Spectrometer (ICP-OES).

From Agilent Technologies, Inc. 2 Jul 2014

Forecast Report on Global Failure Analysis Equipment Market

Research and Markets has announced the addition of the "Failure Analysis Equipment Market - Global Industry Analysis, Size, Share, Growth, Trends and Forecast, 2012 - 2019" report to their offering.

From Research and Markets 2 Jul 2014

Advantest Introduces MPT3000 NEO-SSD Product for Testing Advanced Solid-State Drives

Leading semiconductor test equipment supplier Advantest Corporation has introduced the first member of its NEO-SSD family of products for testing advanced solid-state drives (SSDs) by launching its flexible MPT3000 system, which enables accelerated SSD product development and faster time-to-manufacturing ramp.

26 Jun 2014

New Tool to Validate Authentic Semiconductors from Corelis

Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced today the introduction of the JTAG Interrogator, a simple software tool designed to assist in the validation of authentic semiconductors.

26 Jun 2014

‘Sensing Skin’ Serves as an Early Warning System for Concrete Structures

Researchers from North Carolina State University and the University of Eastern Finland have developed new “sensing skin” technology designed to serve as an early warning system for concrete structures, allowing authorities to respond quickly to damage in everything from nuclear facilities to bridges.

24 Jun 2014

Editorial Highlights