Nordson DAGE, a division of Nordson Corporation, announces that it has been awarded a 2014 SMT China Vision Award in the category of Functional Test for its 4000 Optima Bondtester with Unique Multi-function Cartridge. The award was presented to the company during an April 23, 2014 ceremony at the Shanghai World Expo Exhibition & Convention Center during NEPCON China.
PANalytical, the world’s leading supplier of analytical instrumentation and software for X-ray and related techniques, organizes a free webinar on total scattering technique and PDF analysis taken place on 29 April 2014, presented by Marco Sommariva, Application Specialist XRD, PANalytical B.V., the Netherlands.
New from Mecmesin, the Helixa precision torque tester has been designed for achieving precise alignment when using the most sensitive torque sensors. It is a significant development in the torque testing of finely engineered components.
At the Respiratory Drug Delivery (RDD) 2014, specialists from Malvern Panalytical will present a new approach to help accelerate the development of dry powder inhalation (DPI) formulations.
The wire blank shoots from the drawing die which molds it into the desired shape. Up to ten meters per second, the workpiece is fast – and thus can keep pace with world-class runners like Usain Bolt. At these speeds, an in-line inspection – inspecting the workpiece during the production process – would have been inconceivable, until now.
For sorting laser harmonics and other applications, McPherson (Chelmsford, MA) is pleased to present a new conical-diffraction, off-plane X-ray Czerny-Turner (OP-XCT). Designed for operation from 8 to 125 nm (10 to 150 eV), the OP-XCT operates as a monochromator or imaging spectrograph. With a coarse diffraction grating and CCD, it can survey a very broad EUV wavelength swath, dispersing from 10 to 140 nm on a detector 12 mm wide.
Altatech, a subsidiary of Soitec, announced today that the company received an order for its Orion LedMax wafer inspection and metrology system from OSRAM Opto Semiconductors GmbH, one of the world's leading manufacturers of opto electronic components. OSRAM will use the tool to improve the performance, cost efficiency and yield of its LED-processing operations.
Sandia National Laboratories has finished eight days of testing a full-scale mock unit representing the aerodynamic characteristics of the B61-12 gravity bomb in a wind tunnel.
EMCORE Corporation, a leading provider of compound semiconductor-based components and subsystems for the fiber optics and space solar power markets, announced today that it has received Compound Semiconductor's 2014 CS Industry Award as a joint winner with Lake Shore Cryotronics in the metrology, test and measurement category for EMCORE's terahertz systems technology designed into the Lake Shore 8500 Series Terahertz (THz) System for Material Characterization.
Leading semiconductor test equipment supplier Advantest Corporation announced today that it has started sales of a new terahertz optical sampling system, the TAS7400TS. The flexible design of the new system allows the user to freely configure the terahertz source and detector modules, creating unparalleled versatility. This system can be paired with a variety of terahertz source modules covering three different spectral ranges within the terahertz frequency band.
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