Posted in | Materials Testing and Characterisation | Pittcon 2013

Miniflex 600 Benchtop XRD Instrument from Rigaku at Pittcon 2013

In this video, Tom McNulty, Vice President & General Manager from Rigaku talks about the Miniflex 600 benchtop XRD instrument at Pittcon 2013. The MiniFlex is a general-purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. It is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput.

Other Videos by this Supplier

Rigaku Supermini200 Benchtop WDXRF Spectrometer

Rigaku Supermini200 Benchtop WDXRF Spectrometer
NEX OL Process Elemental Analyzer from Rigaku at Pittcon 2013

NEX OL Process Elemental Analyzer from Rigaku at Pittcon 2013
Rigaku’s Miniflex 600 Benchtop X-ray Diffraction (XRD) Instrument at Pittcon 2013

Rigaku’s Miniflex 600 Benchtop X-ray Diffraction (XRD) Instrument at Pittcon 2013
SuperMini 200 Benchtop Sequential WDXRF Spectrometer from Rigaku at Pittcon 2013

SuperMini 200 Benchtop Sequential WDXRF Spectrometer from Rigaku at Pittcon 2013
MiniFlex 600 X-ray Diffractometer from Rigaku

MiniFlex 600 X-ray Diffractometer from Rigaku
Testimonial of Rigaku SmartLab

Testimonial of Rigaku SmartLab
Quick Halide Soak Method from Rigaku

Quick Halide Soak Method from Rigaku
ZSX Primus Series of wavelength dispersive X-Ray fluorescence spectrometers from Rigaku

ZSX Primus Series of wavelength dispersive X-Ray fluorescence spectrometers from Rigaku
Micro-Z ULS WDXRF from Rigaku

Micro-Z ULS WDXRF from Rigaku
Webinar on Rigaku CrystalClear and dTREK Software Suite

Webinar on Rigaku CrystalClear and dTREK Software Suite

Smart Sample Loading System from Rigaku

Smart Sample Loading System from Rigaku

Smart Sample Loading System for Rigaku ZSX Primus WDXRF Spectrometer

Smart Sample Loading System for Rigaku ZSX Primus WDXRF Spectrometer
Rigaku NEX DE Spectrometer for Routine Elemental Analysis

Rigaku NEX DE Spectrometer for Routine Elemental Analysis
Rigaku nano3DX X-Ray Microscope Measures Large Samples at High Resolution

Rigaku nano3DX X-Ray Microscope Measures Large Samples at High Resolution

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
(Logout)
Submit

Materials Videos by Subject Matter

microCT Technology: Applications, Development and Possibilities

In this interview, Dirk Laeveren and Mark Riccio, Product Marketing Managers for the microCT product line at Thermo Fisher Scientific, discuss microCT, including the possibilities it provides in various applications, and ways to combine it with other visualization techniques.

microCT Technology: Applications, Development and Possibilities

Working Principles of Diffraction Laue Cameras

In this interview, AZoM talks to Daniel Brau, Managing Director of Photonic Science, about the working principles of diffraction Laue cameras, and what makes Photonic Science's Laue crystal orientation systems so special.

Working Principles of Diffraction Laue Cameras
High-Frequency In-Vacuum Cables—to 40 GHz

High-Frequency In-Vacuum Cables—to 40 GHz

For high-frequency signal generation and detection in-vacuum (HV/UHV), Allectra has developed two feedthroughs, the 242-SMAD27G and the 242-SMAD40G, which allow up to 27 and 40 GHz frequencies, respectively. To complement these, we are introducing new K-type SMA cables for in-vacuum use, the 380-SMAK series.

From Allectra Limited