Posted in | Materials Testing and Characterisation

The EM TIC 3X Milling System from Leica Microsystems

The EM TIC 3X Milling System surpasses conventional slope cutting instruments. It can mill at high rates, cut broad and deep into the sample, and create smooth surfaces resulting in high-quality cross-sections of almost any material, quickly and easily.

Run-time 4:19mins

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Leica Microsystems Ergonomy

Leica Microsystems Ergonomy

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Materials Videos by Subject Matter

Insights into microCT technology: evolvement, applications, and automation

In this interview, Dirk Laeveren and Mark Riccio, Product Marketing Managers for the microCT product line at Thermo Fisher Scientific, discuss microCT, including the possibilities it provides in various applications, and ways to combine it with other visualization techniques.

Insights into microCT technology: evolvement, applications, and automation
High-Frequency In-Vacuum Cables—to 40 GHz

High-Frequency In-Vacuum Cables—to 40 GHz

For high-frequency signal generation and detection in-vacuum (HV/UHV), Allectra has developed two feedthroughs, the 242-SMAD27G and the 242-SMAD40G, which allow up to 27 and 40 GHz frequencies, respectively. To complement these, we are introducing new K-type SMA cables for in-vacuum use, the 380-SMAK series.

From Allectra Limited