Posted in | Materials Testing and Characterisation

The EM TIC 3X Milling System from Leica Microsystems

The EM TIC 3X Milling System surpasses conventional slope cutting instruments. It can mill at high rates, cut broad and deep into the sample, and create smooth surfaces resulting in high-quality cross-sections of almost any material, quickly and easily.

Run-time 4:19mins

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Leica Microsystems Ergonomy

Leica Microsystems Ergonomy

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How Sialons Solve the Challenges of Technical Ceramics Manufacturing

AZoMaterials spoke to Ben Melrose, Technical Director at International Syalons, about the grades of sialons that exist, why sialon is the answer to the problem of producing complex shapes with silicon nitride, and how International Syalons are providing the solutions to the challenges associated wi

How Sialons Solve the Challenges of Technical Ceramics Manufacturing