Posted in | Materials Processing

Thin-film multi-layer Measurement

With their metrology tools, FRT can measure simultaneously thin-film multi-layers. In this application video, FRT show you the typical steps of a thin-film multi-layer measurement recipe: sensor referencing, simultaneous point measurements of multiple layers, preview of silicon oxide and silicon nitride thickness, automatic reporting of measurement results and data charts.

Run time: 1:38min

FRT Metrology - Thin Film Multi-layer Measurement

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