Raman Microscopy Guided by Surface Topography Technology Wins Microscopy Today Innovation Award

WITec has just received the prestigious Microscopy Today Innovation Award for the development of True Surface Microscopy.

Each year, the well-respected Microscopy Today magazine selects the best new development in microscopy and presents the award at the US Microscopy and Microanalysis Exhibition and Conference which this year took place in Nashville, TN.

WITec US Managing Director Bob Hirche receives the Microscopy Today Innovation Award 2011 from Microscopy Today Editor in Chief Charles Lyman.

True Surface Microscopy allows confocal Raman imaging guided by surface topography. The topographic coordinates measured from an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. Previously, True Surface Microscopy received the PITTCON 2011 Editors Gold Award and the R&D 100 Award.

"We're almost at a loss for words, as the Microscopy Today Innovation Award is the third honor in the past few months for this technology" says Dr. Joachim Koenen, Managing Director of WITec. "The continuing public recognition of our innovative spirit underlines the potential of True Surface Microscopy for a wide range of surface science applications."

About WITec

WITec is a manufacturer of high performance optical and scanning probe microscopy systems. A modular product line allows the combination of different microscopy techniques such as Raman, SNOM or AFM in a single instrument for flexible analysis of the optical, chemical and structural properties of a sample. The instruments are distributed worldwide and are used primarily in the fields of Materials Science, Life Science and Nanotechnology. WITec is based in Ulm, Germany with regional headquarters in Maryville, TN, USA and Singapore.

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