PANalytical, the world’s leading supplier of analytical instrumentation and software for X-ray and related techniques, announces their free webinar on Analysis of a meteorite using combined technologies demonstrating advanced X-ray capabilities - on 23 June 2016, presented by Christos Tsouris – product manager Zetium, PANalytical B.V., The Netherlands.
Meteorites are fragments of the solar system formation. Most of these meteorites have not gone through any geological transformations over billions of years but have remained intact since the formation of the solar system. Knowing more about the composition and mineral phases of meteorites can bring us a step closer to understanding how the solar system was formed.
This webinar aims to demonstrate the capabilities of using combined technologies for advanced materials analysis. The analysis of a meteorite demonstrates these capabilities but the technique can also be applied to other materials science applications.
Typically the detail in meteorites requires analysis on a much smaller spot size than traditional bulk X-ray fluorescence (XRF) techniques. Small spot analysis and elemental distribution mapping was conducted using a Zetium XRF spectrometer. Elemental compositions and mapped illustrations (qualitative and standardless) were then compared to phase identification using X-ray diffraction for cross verification. To further study the meteorite, 3D CT measurements were also conducted using an Empyrean X-ray diffractometer. The discussion will include some of the practical aspects of the measurements including the time needed to conduct such measurements.
Christos works as the Zetium Product Manager at PANalytical working specifically with XRF research and development projects. Before joining PANalytical, Christos worked in the mining industry, with Anglo American in South Africa, for 7 years. Here he worked across the value chain of mining, providing XRF and QAQC technical support to laboratories, or developing new XRF methods.
Title: Analysis of a meteorite using combined technologies demonstrating advanced X-ray capabilities
Date: 23 June 2016
Time: 10:00 AM EDT New York (4:00 PM CET)
Duration: 45 minutes
Presenter: Christos Tsouris – product manager Zetium, PANalytical B.V., the Netherlands
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For more information on PANalytical’s scheduled webinars see www.panalytical.com/webinars or read more about their mining solutions on