Jan 3 2007
A new state-of-the-art Kratos Axis Ultra X-Ray Photoelectron Spectrometer, one of the most advanced machines of its kind in existence worldwide, has been incorporated into the surface analysis laboratory at CSMA.
The investment will further enhance CSMA’s already impressive surface analysis resources frequently utilised by the engineering and manufacturing sectors to research product improvements and identify potential problems.
The machinery will facilitate quantified elemental depth profiling using ion beam etching, as well as non-destructive angle-resolved depth profiling. This type of analysis provides a clearer picture of any buried defects and interfaces present in a sample that could be causing problems such as de-laminations.
The new XPS also allows complex chemical-state information to be more easily identified as previously overlapping chemical peaks become more distinctive thanks much higher data resolution.
Additionally, the Kratos Axis XPS will enable experts at CSMA to carry out elemental and oxidation-state imaging – thus providing quantitative information previously unavailable.
Chris Pickles, managing director of CSMA, comments: “The new Kratos Axis XPS is an important investment for CSMA as, combined with the analysis skills and experience of the team here, it cements the company’s position as a world leader in the field of surface analysis. There are no other labs in the world that can boast the same level of specialist expertise.”