Oxford Instruments has launched a new, portable X-Ray Fluorescence (XRF) analyser with vacuum pump for the analysis of light metal alloys. The X-MET3000TXV+ can now measure silicon and magnesium in aluminum and the aluminium in titanium alloys in airplane components that were previously not measurable with portable XRF instruments. With one pull of the trigger, the light weight X-MET3000TXV+ delivers faster-than-ever results for rapid and accurate alloy identification as well as a detailed quantitative analysis of the sample composition.
This unit brings the most value to users in applications where Optical Emission Spectroscopy cannot be used because of the mark the technique leaves on the surface. X-MET3000TXV+’s light element capability is especially useful in the aerospace and related industries where aluminum and titanium alloys are widely used. With this system, there is no compressed gas bottle to carry, the cost of consumables is eliminated and inspection won’t stop when the gas runs out.
With traditional portable XRF analysers, alloy identification has been based on the analysis of the heavy elements because magnesium, aluminum and silicon produce low energy x-rays that are impeded by air. The portable vacuum pump of the X-MET3000TXV+ evacuates the analysis path of air, making the measurement of these elements possible.
The new vacuum feature is enhanced by the high resolution PentaPIN™ detector that delivers faster analysis and lower detection limits. It is configured primarily to identify aluminum and titanium alloys which are differentiated only by their concentration of silicon or magnesium. The X-MET3000TXV+ can perform to the same high standard of the X-MET3000TX+ analyzer on all other alloy types (stainless steel, copper alloys, etc.).
Inclusion of the new PentaPINTM detector - which is based on the Oxford Instruments’ proven and patented PentaFET® technology - enables faster analysis and lower detection limits for all elements to be analyzed. Low detection limits are an irreplaceable feature due the exacting standards of the aerospace industry. With the PentaPINTM detector, a ten second analysis produces the equivalent of a thirty second analysis made using an instrument with a standard Si-PIN detector. New improved software has been implemented to process the data generated by the detector and increases the accuracy of the results obtained.