The CAMECA NanoSIMS is a unique ion microprobe optimizing SIMS analysis performance at high lateral resolution. It is based on a coaxial optical design of the ion gun and the Secondary ion extraction, and on an original magnetic sector mass analyzer with multicollection.
Using NanoSIMS to Understand Segregation and Diffusion of Elements in Polycrystalline Materials
The NanoSIMS is used here to contribute to the understanding of the segregation and diffusion of elements in polycrystalline materials.
Unique Capabilities Offered by NanoSIMS
The NanoSIMS offers unique capabilities of combining high lateral resolution and benchmark sensitivity for material characterization. It is the only instrument capable of imaging trace elements or isotopic enrichment down to 50nm resolution. Other technologies are limited in sensitivity (TEMS-EELS, EDS, Auger, TOF-SIMS,...) or lateral resolution (conventional SIMS, laser-ICPMS, SEM-EDS, Raman, XPS).
This information has been sourced, reviewed and adapted from materials provided by CAMECA SAS.
For more information on this source, please visit CAMECA SAS.