The Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System offers completely automated multi-technique analysis along with high throughput without sacrificing research grade results. Integration of multiple analytical techniques such as ISS, UPS, REELS and Raman enables users to perform true correlative analysis, revealing the potential for additional advances in ultra-thin films, microelectronics, nanotechnology development and various other applications.
Specifications
| |
Catalog number |
Item Description |
| ★ |
IQLAADGACKFAQUMBJN |
Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities |
|
| Product Size |
- |
| Analyzer Type |
180°, double-focusing, hemispherical analyzer with 128-channel detector |
| Depth Profiling |
EX06 monatomic ion source or MAGCIS dual mode ion source |
| X-Ray Source Type |
Monochromated, micro-focused, low power Al Ka X-ray source |
| X-Ray Spot Size |
10 - 400 µm (adjustable in 5 µm steps) |
| Optional Accessories |
UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, sample bias module, vacuum transfer module, adaptor for glove box integration |
| Item Description |
Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities |
| Sampling Area |
3600 mm2 |
| Thickness (Metric) Max. Sample |
20 mm |
| Vacuum System |
2 x 260 l.s-1 turbo molecular pumps, with automated titanium sublimation pump, and backing pump |
Description
Material Analysis and Development
The Nexsa spectrometer is capable of delivering flexibility to maximize the potential of the material. Flexibility is offered in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintaining research quality results.
Powerful Performance from Standard Features:
- Insulator analysis
- Small spot analysis
- Depth profiling
- Multi-technique integration
- High performance spectroscopy
- Tilt Module for ARXPS measurements
- Dual-mode ion source for expanded depth profiling capabilities
- Avantage Software for instrument control, data processing and reporting
Optional Upgrades: Add any of the incorporated and fully automated techniques to the analysis. Run at the touch of a button.
- UPS: Ultraviolet photoelectron spectroscopy is the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, to define molecular orbital energies in the valence region
- Raman: Spectroscopic technique employed in chemistry in order to provide a structural fingerprint
- ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
- REELS: Reflection electron energy loss spectroscopy
SnapMap
Sample features can be brought into focus with SnapMap's optical view. The optical view helps to pin point areas of interest rapidly while developing a completely focused XPS image in order to further define an experiment.
- X-rays illuminate a small area on the sample
- Photo electrons from that small area are collected and focused into the analyzer
- Spectra are continually obtained as the stage is moving
- Stage position monitored throughout data acquisition, positions used to generate SnapMap
Application Areas
- Catalysts
- Ceramics
- Glass coatings
- Graphene
- Batteries
- Biosurfaces
- Metals and oxides
- Nanomaterials
- Semiconductors
- OLEDs
- Polymers
- Solar cells
- Thin films