Nexsa X-Ray Photoelectron Spectrometer (XPS) System from Thermo Scientific™

The Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System offers completely automated multi-technique analysis along with high throughput without sacrificing research grade results. Integration of multiple analytical techniques such as ISS, UPS, REELS and Raman enables users to perform true correlative analysis, revealing the potential for additional advances in ultra-thin films, microelectronics, nanotechnology development and various other applications.

Specifications

Catalog number Item Description
IQLAADGACKFAQUMBJN Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
Product Size -
Analyzer Type 180°, double-focusing, hemispherical analyzer with 128-channel detector
Depth Profiling EX06 monatomic ion source or MAGCIS dual mode ion source
X-Ray Source Type Monochromated, micro-focused, low power Al Ka X-ray source
X-Ray Spot Size 10 - 400 µm (adjustable in 5 µm steps)
Optional Accessories UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, sample bias module, vacuum transfer module, adaptor for glove box integration
Item Description Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
Sampling Area 3600 mm2
Thickness (Metric) Max. Sample 20 mm
Vacuum System 2 x 260 l.s-1 turbo molecular pumps, with automated titanium sublimation pump, and backing pump

Description

Material Analysis and Development

The Nexsa spectrometer is capable of delivering flexibility to maximize the potential of the material. Flexibility is offered in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintaining research quality results.

Powerful Performance from Standard Features:

  • Insulator analysis
  • Small spot analysis
  • Depth profiling
  • Multi-technique integration
  • High performance spectroscopy
  • Tilt Module for ARXPS measurements
  • Dual-mode ion source for expanded depth profiling capabilities
  • Avantage Software for instrument control, data processing and reporting

Optional Upgrades: Add any of the incorporated and fully automated techniques to the analysis. Run at the touch of a button.

  • UPS: Ultraviolet photoelectron spectroscopy is the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, to define molecular orbital energies in the valence region
  • Raman: Spectroscopic technique employed in chemistry in order to provide a structural fingerprint
  • ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
  • REELS: Reflection electron energy loss spectroscopy

SnapMap

Sample features can be brought into focus with SnapMap's optical view. The optical view helps to pin point areas of interest rapidly while developing a completely focused XPS image in order to further define an experiment.

  1. X-rays illuminate a small area on the sample
  2. Photo electrons from that small area are collected and focused into the analyzer
  3. Spectra are continually obtained as the stage is moving
  4. Stage position monitored throughout data acquisition, positions used to generate SnapMap

Application Areas

  • Catalysts
  • Ceramics
  • Glass coatings
  • Graphene
  • Batteries
  • Biosurfaces
  • Metals and oxides
  • Nanomaterials
  • Semiconductors
  • OLEDs
  • Polymers
  • Solar cells
  • Thin films

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