Velox Software for Advanced STEM and TEM Material Imaging and Analysis

Thermo Scientific Velox Software integrates complete access to (scanning) transmission electron microscope (STEM and TEM) optics and detectors to give users the best possible experimental control. Velox Software provides high yield, reproducibility, and support for quantitative STEM and TEM material analysis.

In conjunction with the Thermo Scientific Super-X and Dual-X Detector Systems, Velox Software provides special packages for energy-dispersive X-Ray spectroscopy (EDS, also called EDX) applications. A robust mapping engine combines multiple techniques optimized for transmission electron microscopy. The highest yield of EDS spectrum images can be obtained with on-the-fly drift correction, recursive mapping, independent channel readout, and unique absorption correction with holder compensation.

Velox Transmission Electron Microscopy Software Features

Integrated Ergonomic User Interface

Superior quality in imaging and compositional mapping through sophisticated drift compensation techniques such as cross correlations in quick recursive mapping and drift corrected frame integration (DCFI). Furthermore, Velox Software provides drift compensation for spectrum imaging—a feature created especially for difficult TEM environments.

Time-Resolved XEDS

Frame-by-frame removal through recursive mapping using the "peel back" function and time-resolved XEDS allows for dynamic compositional mapping, which reduces artifacts on compositional analysis on beam-sensitive material.

High-Contrast Imaging

Light and heavy element high-contrast atomic imaging using a novel integrated differential phase contrast (iDPC) mode. low-dose, high-contrast imaging of light samples to capture natural-state images of materials sensitive to beams.

Interactive Detector Layout Interface

Maximum repeatability, optimal experimental management, and comprehensive documentation of multidetector instruments through an interactive detector layout interface and automated retention of all essential metadata.

EDS Quantification Software

Robust, unique EDS quantification software with four independent detector readouts and compensation of holder shadowing at any tilt. Fast post-processing of EDS data and real-time feedback during acquisition are provided by high-speed EDS quantification.

Dynamic Studies

Flexible STEM and TEM movie recording for dynamic studies.

Specifications

Source: Thermo Fisher Scientific – Electron Microscopy Solutions

* optional and functions only available if corresponding hardware is part of the column configuration.