The Phenom Pharos G2 FEG-SEM from Thermo Scientific helps bring field emission SEM to users’ tabletop. The Phenom Pharos G2 FEG-SEM will outshine various floor-standing SEMs when it comes to image quality while providing a largely better user experience.
The Phenom Pharos G2 FEG-SEM makes FEG performance accessible, as a result of its appealing form factor and short training needed, for industrial and academic laboratories that until now did not consider SEM to be a realistic option.
Extremely fast sample loading enables fast sample exchange, which enables higher productivity. In contrast to other SEMs, which end up being completely booked, the Phenom Pharos G2 FEG-SEM executes imaging and analysis so fast that it serves well as a walk-up tool.
The new Phenom Pharos G2 FEG-SEM extends its acceleration voltage range down to 1 kV, to better house insulating and beam-sensitive samples, and up to 20 kV, featuring a resolution of 2.0 nm that displays the best details.
Unique Field Emission Source
The Phenom Pharos G2 FEG-SEM is unique among desktop SEMs and provides a field emission source, ensuring crisp images, high brightness and stable beam current.
Excellent Resolving Power
The Phenom Pharos G2 FEG-SEM provides a resolution of 2.0 nm at 20 kV. Such performance displays the shape of nanoparticles, imperfections in coatings or other features that would have been lost by tungsten SEMs or other tabletop SEMs.
The Phenom Pharos G2 FEG-SEM has a voltage range down to 1 kV and allows imaging of beam-sensitive samples, like polymers, as well as insulating samples, without the need to apply a coating. As a result, nanoscale surface features are not concealed.
While FEG SEMs are hard to house and difficult to operate, the Phenom Pharos G2 FEG-SEM just needs a desk and less than one hour of training. Normally, masters students, visitors or other scientists who are not trained to work on high-end FEG SEMs can easily use the Phenom Pharos G2 FEG-SEM to make eye-catching images.
A World of Information
The Phenom Pharos G2 FEG-SEM acquires morphological data collectively with compositional information with the help of SE, BSE and EDS detectors integrated into the system. It comes with a range of sample holders for temperature-controlled or electrical experiments.
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
- 2.0 nm (SE), 3 nm (BSE) at 20 kV
- 10 nm (SE) at 3 kV
|Electron optical magnification range
|Light optical magnification
- Default: 5 kV, 10 kV and 15 kV
- Advanced mode: adjustable range between 1 kV and 20 kV
- High vacuum mode
- Medium vacuum mode
- Integrated charge reduction mode (low vacuum mode)
- Back scattered electron detector (standard)
- Energy-dispersive X-ray spectroscopy (EDS) detetor (optional)
- Secondary electron detector (optional)
- Up to 25 mm diameter (32 mm optional)
- Up to 35 mm (100 mm optional)