Faster Analysis of Large Samples with Phenom XL G2 Desktop SEM

The Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates quality control procedures, providing accurate, reproducible results while freeing up time for more important work. 

Users can use the Phenom XL G2 Desktop SEM to:

  • Get the high-quality data required to identify errors early and quickly modify the production process as necessary
  • Automate quality control to process a high volume of samples with fewer chances of human error
  • Get up to speed fast with an all-new, simple interface suitable for a wide range of applications

The Phenom XL G2 Desktop SEM features full-screen images and an average time-to-image of 60 seconds. With less maintenance required, the unique CeB6 electron source ensures a long lifespan. The small form factor requires little lab space, allowing users to place the microscope exactly where they need it.

Key Features


The Phenom Programming Interface (PPI), a potent way to control the Phenom XL G2 Desktop SEM with Python scripting, is the main means of accessing the Phenom XL G2 Desktop SEM. The equipment can automatically examine particles, pores, fibers, or huge SEM images if the user has an SEM process that requires repetitive labor.

Element Identification (EID)

An energy-dispersive X-Ray spectroscopy (EDS) detector is an optional accessory for the Phenom XL G2 Desktop SEM that may be used to identify elements using X-Ray analysis and provide additional material insights.

Built-In Assurance

By removing the need to transfer samples to other instruments, the desktop SEM helps preserve sample integrity while saving time and money.

Long-Lifetime CeB6 Source

The long-lifetime CeB₆ (cerium hexaboride) source has several advantages. First is the high brightness it provides compared to tungsten, making it much easier for many users to obtain high-quality images with many details. Secondly, the lifetime of the source is very long, and maintenance can be scheduled.

Step-By-Step Data Collection

The completely integrated EDS detector is controlled by a proprietary software package called elemental identification software package (EID). The intuitive step-by-step process within the EID software allows the user to collect all X-Ray results in an organized and structured manner.

Eucentric Sample Holder

In many SEM applications, users can gain more insight into sample properties if the sample can be tilted and rotated. The optional eucentric sample holder enables eucentric tilt and rotation, making research and analysis faster and more accurate.

Phenom XL G2 Argon-Compatible Desktop SEM

The Thermo Scientific Phenom XL G2 Argon-Compatible Desktop Scanning Electron Microscope (SEM) automates workflows while providing a stable, non-reactive environment for reactive sample research.

The Phenom XL G2 Argon-Compatible Desktop SEM provides:

  • A safer way to interface with highly volatile samples such as solid-state lithium, enabling the next generation of longer-lasting, eco-friendly batteries
  • A non-reactive setting in which research on reactive samples, such as solid-state lithium batteries, can be conducted
  • A modality where you can have sample preparation and SEM/EDS analysis in the same workspace
  • Dry Room Compatibility. This system has been tested and approved to work in dry room environments with dew temperatures as low as –65 °C.

The Phenom XL G2 Argon-Compatible Desktop SEM offers the same remarkable 40-second image capture speed as the standard Phenom XL G2 SEM, while also being able to be placed in an argon glove box, assuring the safe analysis of solid-state lithium.


Source: Thermo Fisher Scientific – Electron Microscopy Solutions

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Electron imaging
  • Long lifetime thermionic source (CeB6 )
  • Multiple beam currents
Electron imaging magnification range
  • 160 - 200,000x
Light imaging magnification
  • 3–16x
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low - medium - high
  • Backscattered electron detector (standard)
  • Secondary electron detector (optional)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm height (optional up to 65 mm)
Sample loading time
  • Light optical <5 s 
  • Electron optical <60 s

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