Microscale Technical Cleanliness With Phenom ParticleX TC Desktop SEM

The Thermo Scientific Phenom ParticleX TC Desktop SEM is a versatile desktop SEM that facilitates technical cleanliness at the microscale level.

Materials Characterization

The Phenom ParticleX Desktop SEM provides a versatile solution for high-quality, in-house analysis. This system empowers users to conduct rapid characterization, verification, and classification of materials, thereby supporting production with prompt, accurate, and reliable data.

With its user-friendly operation and quick learning curve, the system broadens access to particle and material analysis, making it accessible to a wider group of users.

Key Features

Technical Cleanliness

With the growing demand for analysis of smaller particles beyond the scope of light microscopy within (automotive) industries, the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM enables automated scanning electron microscopy with energy-dispersive X-Ray spectroscopy (EDS). 

This presents a significant advantage over light microscopy, as it allows for the chemical classification of particles, offering valuable insights into production processes and environments. The system provides standard reports compliant with VDA 19 / ISO 16232 or ISO 4406/4407.

Secondary Electron Detector

Optionally, the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM offers a secondary electron detector (SED). The SED is designed to gather low-energy electrons from the sample's top surface layer, making it an ideal choice for unveiling detailed information about the sample surface.

The SED can be highly beneficial in applications where topography and morphology are important. This is often the case when studying microstructures, fibers, or particles.

General SEM Usage

The user interface is based on the proven ease-of-use technology that us used in Phenom desktop SEM products. The interface enables existing and new users to quickly become familiar with the system with minimal training. 

Elemental Mapping and Line Scan

For users, utilizing the elemental mapping and line scan functionality of the Phenom ParticleX TC (Technical Cleanliness) Desktop SEM is as straightforward as a simple click to get started. The line scan functionality presents the quantified element distribution in a convenient line plot.


Source: Thermo Fisher Scientific – Electron Microscopy Solutions

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Electron imaging
  • Long lifetime thermionic source (CeB6 )
  • Multiple beam currents
Electron imaging magnification range
  • 160 - 200,000x
Light imaging magnification
  • 3–16x
  • <10 nm
Image resolution options
  • 960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels
Acceleration voltages
  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode
Vacuum levels
  • Low - medium - high
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
  • Secondary electron detector (optional)
Sample size
  • Max. 100 mm x 100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm height (optional up to 65 mm)
Sample loading time
  • Light optical <5 s 
  • Electron optical <60 s

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