At the Microscopy & Microanalysis 2017 Meeting Bruker today presents XMethod, the world’s first software package for the analysis of composition and thickness of single or multiple layers, based on data obtained by sample excitation with the XTrace micro-focus X-ray source for scanning electron microscopes (SEM). The software enables the characterization of thin films and multi-layer structures of thickness ranging from a few nanometers up to 40 microns without the need for cross sectioning the sample.
The range of Metrohm ion chromatography systems running Waters’ «Empower» software has become bigger. Next to Metrohm IC systems with conductivity detection now also Metrohm systems for combined anion and cation analysis as well as systems with amperometric detection can be controlled by Waters software.
EdCentra software enhances sub-fab operations with advanced fault detection, predictive maintenance, and real-time monitoring for optimal equipment performance.
Leica's LAS AF 3 software streamlines microscopy workflows, combining ergonomic design with powerful imaging tools for improved efficiency and reproducibility.
Tokyo, Japan & Besançon, France: the release of new Hitachi map 3D software based on Mountains® Technology opens up a new world of opportunities for researchers and industrial engineers using Hitachi High-Technologie’s cutting-edge scanning electron microscopy (SEM) systems.
TA Instruments announces the introduction of the all-new WinTest® 8.0 software package. WinTest® is the powerful user interface and controls platform that is used across all TA ElectroForce® products. The ElectroForce Mechanical Test Instruments are used for fatigue, durability and dynamic characterization of materials such as rubber, automotive components, biomaterials and medical devices.
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