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Uniscan Instruments Introduces Latest Software Package for M370 Scanning Probe Systems

JEOL Receives Major Order for JEM-ARM200F Transmission Electron Microscope from NIST

JEOL Receives Major Order for JEM-ARM200F Transmission Electron Microscope from NIST

CRAIC Establishes Grant Program for Purchasers of Microspectrophotometers and UV-Visible-NIR Microscopes

CRAIC Establishes Grant Program for Purchasers of Microspectrophotometers and UV-Visible-NIR Microscopes

PV Durability Asia Conference to be Held from December 7 to 8, 2010

Micromeritics to Sponsor Carbon-Based Nanoporous Materials Symposium

LayTec Launches EpiCurveTT AR for Measuring Aspherical Curvature During Epitaxial Growth

LayTec Launches EpiCurveTT AR for Measuring Aspherical Curvature During Epitaxial Growth

LayTec Install EpiCurve TT System at Fraunhofer Institute for Applied Solid State Physics

LayTec Install EpiCurve TT System at Fraunhofer Institute for Applied Solid State Physics

BT Imaging Announces New Inline Photovoltaic Cell Process Quality Monitor

BT Imaging Announces New Inline Photovoltaic Cell Process Quality Monitor

Elliot Scientific Now Offering CRAIC Technologies 308 PV UV-visible-NIR Spectrophotometer

Materials Characterization Company Malvern Receives 2010 Queen's Award for Enterprise in Innovation

Materials Characterization Company Malvern Receives 2010 Queen's Award for Enterprise in Innovation

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