Capturing Large and Fast-Moving Scenes with Optimal Use of Lighting Power Using the Hydra3D CMOS Sensor Ha Lan DO THU Ha Lan DO THU, marketing manager for 3D products and applications at Teledyne e2v, speaks to AZoM about the Hydra3D CMOS Sensor, and how it can capture large and fast-moving scenes using optimal lighting power.
The Role of Electron Microscopy in Battery Research Dr. Y. Shirley Meng In this interview, AZoM talks to Dr. Y. Shirley Meng, Professor of Materials Science at the University of San Diego, about battery research, and how electron microscopy plays a vital role within it.
Hybrid Pixel Technology Provides Data that You Can Rely On, An Indispensible Advancement for TEMs Yemliha Bilal Kalyoncu In this interview, AZoM talks to Yemliha Bilal Kalyoncu, Application Engineer at Amsterdam Scientific Instruments about how an indispensable advancement for TEMs is provided by hybrid pixel technology.
Reliable TOC/TNb Analysis: multi N/C SeriesThe multi N/C instruments offer you customized solutions for reliable TOC/TNb measurements in your field of application. From Analytik Jena US
Portable and High-Resolution Video Inspection with the IPLEX GX/GT VideoscopeDiscover specialized pipe inspection with the IPLEX GX/GT Videoscope. From Olympus Scientific Solutions Americas - Industrial Microscopy
Ion Beam Cross Section Polisher (CP): IB-19530CPThe IB-19530CP Ion Beam Cross Section Polisher (CP) produces pristine cross sections of samples—hard, soft, or composites—without smearing, crumbling, distorting, or contaminating them in any way. From JEOL USA, Inc.
SEM and EBSD Analysis of the Grain Structure After ECAP Process of the Aluminum Material From TESCAN USA Inc. 23 Sep 2020