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EV Group Unveils Next-Generation UV-Nanoimprint Lithography (UV-NIL) Step and Repeat System

Veeco Joins Microsystems Industry Group and Donates Optical Profiler

Abstract Deadline Extension for PowerMEMS 2009 Workshop

Wacker Look to Optimize Semiconductor Subsidiary

Nanometrics Wins Orders for Photoluminescence Mapping Metrology Systems from LED Manufacturer

Light Detecting Fibres in Soldier's Uniforms Identify Threats in All Directions

Light Detecting Fibres in Soldier's Uniforms Identify Threats in All Directions

Making Better Solar Panels using Light-Absorbing Nanowires

Making Better Solar Panels using Light-Absorbing Nanowires

Profiling Interface Electron Gas using X-ray Photoelectron Spectroscopy

Profiling Interface Electron Gas using X-ray Photoelectron Spectroscopy

Imperial Researchers Honoured In Institute Of Physics' Annual Awards

Imperial Researchers Honoured In Institute Of Physics' Annual Awards

New Particle-Sensing Technology in Validating, Analyzing Real-Time Wafer Contamination

New Particle-Sensing Technology in Validating, Analyzing Real-Time Wafer Contamination

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