Posted in | Materials Testing and Characterisation

Zeiss Webinar on 3View Technology

This video shows a presentation on SBF-SEM - Serial Block Face 3D imaging in the FE-SEM with 3View technology by Carl Zeiss Microscopy and Gatan. The presentation is delivered by Martin Edelmann from Carl Zeiss, Joel Mancuso from Gatan, and Thomas Deerinck, NCMIR scientist at the UCSD.

Run Time – 58:53min

ZEISS Webinar: Fast and Convenient 3D Imaging for Tissue Samples in the FE-SEM

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