MERLIN Scanning Electron Microscope from Carl Zeiss

This video from Carl Zeiss shows the AFM system, which is ready in a matter of minutes to deliver atomic surface topographical resolution in 3D. Thanks to the AFM techniques, this data is already calibrated on atomic scale level opening the next resolution dimension to users of scanning electron microscopes.

Run Time – 1:24min

ZEISS MERLIN FE-SEM - Atomic Force Microscopy (AFM)

Other Videos by this Supplier

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Your comment type

Materials Videos by Subject Matter