The Dimension Fastscan Atomic Force Microscope (AFM) from Bruker Nano
The Dimension Fastscan from Bruker is the fastest AFM on the market. John Thornton takes us for a tour of this instrument pointing out key features and runs a demonstration to illustrate how fast data can be collected. The speed of this instrument make it suited to rapid sampling across large samples and production environments where speed is critical.
The Dimension Fastscan is based on the Dimension Icon system and can operate in contact, tapping and peak force modes. The 300mm chuck enables it to work with large samples, although small samples can be dealt with just as easily.
Run time - 7:03min