Synergies Resulting from the Acquisition of Veeco Businesses by Bruker Nano
Frank Laukien, President and CEO of Bruker Corporation, and Mark Munch, President of the Bruker Nano Surfaces Business welcomes the Veeco Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM)
instruments to the Bruker family and tell us how Veeco products, staff and clients will benefit from the new organization and the increased resources now available as a consequence of the merger.
Run Time - 3:32
AFM | Bruker Corporation acquires Veeco Metrology & Instrumentation