Posted in | Materials Testing and Characterisation | MRS 2010 Fall Meeting | Nanomaterials

Demonstration of Improved Resolution from Optical Profilers Using AcuityXR Technology from Bruker Nano

Chris Orsulak from Bruker points out the main features of the ContourGT Optical Profiler and briefly describes how it works. he also shows us how it can take measurements in very short time frames and how the new AcuityXR measurement mode (introduced at the 2010 MRS Fall Meeting) can produce improved results due to the increased lateral resolution.

Run Time - 4:13min

Demonstration of the Bruker ContourGT Optical Profiler

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