Posted in | Materials Testing and Characterisation | MRS 2011 Fall Meeting

The Innova-IRIS Combined AFM-Raman from Bruker XRD

We spoke to Stefan Kaemmer at the 2011 MRS Fall Meeting in Boston and he gave us a run down on their new Innova-IRIS system which combines the Bruker Innova AFM with the Renishaw raman confocal microscope. The system allows you to correlate chemical and topographical information at the same time.

Run time - 5:51min

The Innova-IRIS AFM-Raman System from Bruker

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