Dr Graham Rideal, CEO of Whitehouse Scientific will present a paper on the topic of 'Measuring the maximum pore size of small profile filter elements' at this year's FILTECH conference. FILTECH 2011 takes place from 22-24 March in Wiesbaden, Germany and Whitehouse Scientific is also exhibiting at the associated trade show.
A world leading supplier of calibration standards, Whitehouse Scientific has developed a method for determining the cut point of filter media. Using specially prepared, precision glass microspheres to challenge the filter, it is possible to measure filter efficiencies within micron resolutions. The method uses narrow particle size distribution standards and covers pore sizes from just a few microns to over 600 microns. The results are highly reproducible and traceable to international standards, for example NIST.
FILTECH 2011 Conference features 180 papers from 31 countries and provides a representative survey of current research findings and state-of-the-art developments for the solution of filtration and separation targets in a wide range of sectors. FILTECH 2011 conference also features a plenary lecture and six survey lectures.