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LatticeGear has developed a simple method that is repeatable for cleaving small samples such that it keeps the sample face clean. This is often needed for examining samples in a high-resolution scanning electron microscope.
The video shows how to make a sample 4 mm x 3 mm in size from a larger sample using the LatticeAx system. Any of the several available LatticeAx systems can be used. The sample is first marked clearly for cleaving along two sides. The sample is indented along one side first along the marked line. It is then picked up with a vacuum tweezer to avoid damage and then held with a regular tweezer. The sample is then cleaved using LatticeGear small pliers for sample cleavage. The same process is repeated on the other side.
Downsizing samples for examination in SEMs with height restrictions using the LatticeAx
This information has been sourced, reviewed and adapted from materials provided by LatticeGear.
For more information on this source, please visit LatticeGear.