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ZEISS X-ray Microscopy (XRM) Solution Increases Nanoscale X-ray Imaging Speed By A Factor Of Ten

ZEISS X-ray Microscopy (XRM) Solution Increases Nanoscale X-ray Imaging Speed By A Factor Of Ten

ZEISS Launches Next Generation EVO Series At M&M 2013, Indianapolis

ZEISS Launches Next Generation EVO Series At M&M 2013, Indianapolis

Bruker Launches Two New Accessories for Electron Microscopy at M&M 2013

Bruker Launches Two New Accessories for Electron Microscopy at M&M 2013

Hosokawa Micron Launch New 3 in 1 Drymeister-H

Hosokawa Micron Launch New 3 in 1 Drymeister-H

New Accelerating Rate Calorimeter Announced By Netzsch

New Accelerating Rate Calorimeter Announced By Netzsch

Leica Microsystems Launches High-Precision Scanning Stage for Stereo Microscopes and Macroscopes

Leica Microsystems Launches High-Precision Scanning Stage for Stereo Microscopes and Macroscopes

Instron Release New Grips for High-Volume Production Testing

Instron Release New Grips for High-Volume Production Testing

Freeman Technology to work with E/M Coating Services (EMCS) to Develop New Surface Coating Solutions

New Publication by Woodhead Publishing on Recycled Concrete and Demolition Waste

Applied Rigaku Technologies Introduce New Application on the Analysis of Crude Oil by Dispersive X-ray Fluorescence

Applied Rigaku Technologies Introduce New Application on the Analysis of Crude Oil by Dispersive X-ray Fluorescence

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