Posted in | News | Materials Analysis

New Silicon Drift Detector for EDXRF Elemental Analyzer Enables Faster Analysis With Better Limits of Detection

Designed to dramatically improve elemental analysis capabilities for a broad range of applications, the new SDD1000 detector for the Thermo Scientific ARL QUANT’X EDXRF spectrometer utilizes a 1,000-micron silicon crystal, more than double the thickness of silicon drift detectors on the market.

The multi-purpose ARL QUANT’X EDXRF (energy dispersive x-ray fluorescence) spectrometer fitted with the SDD1000 detector provides four times higher count rate and better resolution than the instrument’s previous detector, offering improved limits of detection and three times faster measurement. The thickness of the state-of-the-art silicon crystal provides enhanced sensitivity for the detection of heavy elements. Its larger active area provides better performance for lighter to heavier elements.

Key Applications: Environmental, electronics, automotive/machinery, mining, forensics, cement, slags, oil and petrochemicals, paints and polymers, gemology.

Features/Benefits:

  • Improved limits of detection: Wider range of elemental analysis across the periodic table
  • Faster performance: Rapid, accurate analysis of small and large samples (2 mm to 30 cm)
  • Quick start-up: Spectrometer with SDD1000 detector can be stopped overnight and re-started in less than three minutes
  • Broader active area: Captures more photons for better analysis

Web Site: www.thermoscientific.com/quantx

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Thermo Fisher Scientific. (2019, February 08). New Silicon Drift Detector for EDXRF Elemental Analyzer Enables Faster Analysis With Better Limits of Detection. AZoM. Retrieved on April 26, 2024 from https://www.azom.com/news.aspx?newsID=44884.

  • MLA

    Thermo Fisher Scientific. "New Silicon Drift Detector for EDXRF Elemental Analyzer Enables Faster Analysis With Better Limits of Detection". AZoM. 26 April 2024. <https://www.azom.com/news.aspx?newsID=44884>.

  • Chicago

    Thermo Fisher Scientific. "New Silicon Drift Detector for EDXRF Elemental Analyzer Enables Faster Analysis With Better Limits of Detection". AZoM. https://www.azom.com/news.aspx?newsID=44884. (accessed April 26, 2024).

  • Harvard

    Thermo Fisher Scientific. 2019. New Silicon Drift Detector for EDXRF Elemental Analyzer Enables Faster Analysis With Better Limits of Detection. AZoM, viewed 26 April 2024, https://www.azom.com/news.aspx?newsID=44884.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.