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Optical Non-Contact Measurement for Analyzing Ceramic Material During Rapid Heat Treatments

Conventionally sintered ceramics such as porcelain or stoneware are subjected to a viscous flow sintering process.

From TA Instruments 5 Nov 2014

Dynamic Oscillatory Rheology for Determining the Flow Properties of Thermo-Plastic Vulcanisate (TPV)

TPE has become highly popular in the past two decades. They offer attractive properties that are rubber-like enabling aspect and easy plastic processing.

From TA Instruments 5 Nov 2014

Oscillatory Rheology for the Characterization of Thermo-Plastic Rubber

Thermo-plastic elastomers (TPE) are a unique class of materials that offer rubber-like final properties combined with simple plastic processing.

From TA Instruments 5 Nov 2014

Measuring Thermal Conductivity According to the ASTM E1530 Guarded Heat Flow Meter Method

TA Instruments has introduced a range of instruments for the accurate measurement of heat transfer properties in a wide range of materials.

From TA Instruments 5 Nov 2014

Determining the Isoelectric Point (IEP) In Engineered Particles

Exploring isoelectric point (IEP) via zeta potential to predict colloidal stability; methods for dairy creamer and proteins detailed.

From Entegris 4 Nov 2014

Detecting Large Particles in Chemical Mechanical Polishing (CMP)

Entegris AccuSizer FX excels in detecting low concentration large particles in CMP slurries, ensuring slurry health for improved device yields.

From Entegris 4 Nov 2014

Analyzing Inkjet Ink Particle Size and Dispersion to Avoid Sedimentation and Instability

The AccuSizer system effectively quantifies oversized particles in inkjet inks, ensuring optimal printhead performance and stability.

From Entegris 4 Nov 2014

Tunable Laser Monitoring from Resolution Spectra Systems

During the past few years, spectrally tunable lasers have been developed actively to address a number of applications. Several technologies are used for tunable laser such as external cavity laser, DFB diode and OPO.

From Resolution Spectra Systems 3 Nov 2014

Diode Laser Analysis and Control from Resolution Spectra Systems

Determining the spectrum of a diode laser emission at a few µm is required for metrological applications based on other physical phenomena or interferometry such as the Raman effect which requires pure spectra.

From Resolution Spectra Systems 3 Nov 2014