Free Seminar on Ultra-Fast Characterization of I-V Devices

Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Fundamentals of Ultra-Fast I-V Device Characterization" on Thursday, April 29, 2010. This one-hour presentation will examine the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies.

Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics. To register for this event, visit www.keithley.com/events/semconfs/webseminars.

Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. The seminar will also discuss typical test setups and common error sources. Finally, some practical examples of device measurements will be given. Participants will also have the opportunity to ask questions during the event.

Fundamentals of Ultra-Fast I-V Device Characterization is recommended for students, researchers, and engineers doing characterization of materials, processes, and devices; lab managers wanting to learn about this useful measurement technique; and engineers doing device and material reliability studies (for example, WLR, ESD, latchup, etc.).

The seminar will be presented by Lee Stauffer, a senior staff technologist for Keithley Instruments' Semiconductor Measurements Group in Cleveland, Ohio. Prior to joining Keithley, Stauffer's career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

Registration Information.

Fundamentals of Ultra-Fast I-V Device Characterization will be broadcast on Thursday, April 29, 2010 at 15:00 CEST (9:00 a.m. EDT) for the European audience and at 2:00 p.m. EDT for the North American audience. The event is free to the public, but participants must register in advance at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived on Keithley's website for those unable to attend the original broadcast.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Keithley Instruments - Electronic Instruments. (2019, February 10). Free Seminar on Ultra-Fast Characterization of I-V Devices. AZoM. Retrieved on October 20, 2019 from https://www.azom.com/news.aspx?newsID=21276.

  • MLA

    Keithley Instruments - Electronic Instruments. "Free Seminar on Ultra-Fast Characterization of I-V Devices". AZoM. 20 October 2019. <https://www.azom.com/news.aspx?newsID=21276>.

  • Chicago

    Keithley Instruments - Electronic Instruments. "Free Seminar on Ultra-Fast Characterization of I-V Devices". AZoM. https://www.azom.com/news.aspx?newsID=21276. (accessed October 20, 2019).

  • Harvard

    Keithley Instruments - Electronic Instruments. 2019. Free Seminar on Ultra-Fast Characterization of I-V Devices. AZoM, viewed 20 October 2019, https://www.azom.com/news.aspx?newsID=21276.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit