Everett Charles Technologies (ECT), a global provider of electrical test products and services, has announced that it will be showcasing its new HyperCore Base Material at the Silicon Valley 2012 Test Workshop (SVTW) to be held in Santa Clara, California.
ECT’s HyperCore material is a proprietary base product. The company has developed the material for its fine-pitch and highly scalable ZIP probe series. The novel material has a high Knoop hardness of 600. High volume production and cleaning cycles cause wear and deformation of the tip. The non-plated nature of the material gives it a long life and allows the probe to be cleaned repeatedly.
In terms of RF behavior and contact resistance, the HyperCore material is equivalent to a gold plated Beryllium copper material. The HyperCore material demonstrates a performance that does not change even under severe conditions. It resists oxides similar to gold. The ECT Z0-050 HyperCore features a bandwidth greater than 40 GHz and resistance of 50 mW.
ECT will be demonstrating other products belonging to it semiconductor line, such as the Bantam and ZIP contacts. The ZIP Z1 and Z2 are production contacts designed for high-speed and service standard applications in various pitches - .3mm, .4mm, .5mm and .8mm. ECT’s Z8 probes are designed to suit burn-in applications. ZIP KELVIN, ZIP SCRUB, ZIP Extended Length and ZIP SUPER SHORT, which are designed for specific applications, will also be showcased at the event.
The Silicon Valley Test Workshop is slated to take place at the Biltmore Hotel in Santa Clara on 29, August 2012.