Detection Technology Plc, a global provider of X-ray imaging subsystems and components, takes tire inspection intelligence to the next level by launching X-Scan U series. The detector series based on the novel digital platform improves image quality, increases maximum scanning speed and saves the overall system cost of industrial in-line and off-line nondestructive testing (NDT) of tires.
X-Scan U series is an enhanced product family of U-shaped X-ray line cameras developed and optimized specially for high-speed digital tire inspection utilizing panoramic X-ray sources. The series enables the industry leading image quality to meet the tightest quality requirements by providing robust low noise digital signal, homogenous data over the detector active area and the best signal to noise ratio for X-ray imaging.
An average inspection cycle time of truck and bus tires with dual-station system is 25-28 seconds per tire. X-Scan U series helps to reduce the cycle time to 21-24 seconds per tire, giving up to 20% improvement of production efficiency.
The series has the first-class radiation hardness increasing lifetime of the detector, up to two times longer. Combined with the excellent reliability and remote firmware upgrades and diagnostics, the series improves production efficiency even more and minimizes lifetime cost of X-ray systems.
We are taking digital quality inspection of tires to the next level by our advanced electronics and software designs. That’s what the Industry 4.0 is about – intelligence on component, product, system, process and ecosystem levels for greater efficiency with excellent quality.
Fei Wang, Business Development Manager of Security and Industrial Business Unit at Detection Technology.
The standard series is well-suited for quality inspection of various types of tires, from passenger car and truck tires to off-the-road tires. With active lengths from 1382mm to 3379mm the series covers tire bead sizes of 15-17 and 20-335 inches.
X-Scan U series is available globally with short lead times. Detection Technology is showcasing the key features of X-Scan U series at Digital Imaging 2016 conference in in Mashantucket, Connecticut on July 25-26.