The most powerful 3D X-Ray microscope models in the ZEISS Xradia Versa series unlock new levels of versatility for both scientific and industrial research.
The ZEISS Xradia 610 & 620 Versa push the frontiers of non-destructive sub-micron size imaging with industry-leading resolution and contrast.
Highlights
Extending the Limits of Micro- and Nano-CT Solutions
- High resolution across a comprehensive range of sample types, sizes and working distances
- In situ imaging for non-destructive characterization of microstructures overtime in controlled environments
- Advanced flux and faster scans without compromising resolution
- Accurate spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm
- Throughput with image quality
- Non-destructive sub-micron scale microscopy of intact samples
- Upgradeable and extendible with future innovations and improvements
Highest Resolution and Flux
Xradia Versa uses a combination of novel two-stage magnification optics and a high flux X-Ray source to provide faster sub-micron scale resolution images, whereas standard tomography depends on single-stage geometric magnification.
The Resolution at a Distance (RaaD) architecture allows for high-resolution 3D imaging of larger, denser objects, such as components and electronics that are still intact. Quick scans of very big samples (up to 25 kg) are possible with the optional flat panel extension (FPX), which allows navigation to interior regions of interest.
New Degrees of Freedom
For sophisticated scientific and industrial research, users can employ the industry’s most comprehensive 3D X-Ray imaging solution: To get an unprecedented characterization of the materials and their properties, maximize absorption and phase contrast. Diffraction Contrast Tomography can reveal 3D crystallographic information.
With sophisticated acquisition techniques, users can improve the speed and precision of scanning big or irregular samples. Utilize machine-learning methods to assist with sample post-processing and segmentation.
Premier 4D/In Situ Solution
The ZEISS Xradia 600 Series Versa can describe the 3D microstructure of materials non-destructively in situ (under controlled perturbations) and track the evolution of structures over time (4D).
The Xradia Versa retains the best resolution across vast working distances thanks to Resolution at a Distance, which allows it to accommodate both sample, environmental chamber and high precision in-situ load rigs without reducing resolution. To handle multi-scale correlative imaging issues, the Versa works in tandem with other ZEISS microscopes.