The most powerful 3D X-ray microscope models in the ZEISS VersaXRM® series unlock new levels of versatility for both scientific and industrial research.
ZEISS VersaXRM 615 and 730 push the frontiers of non-destructive sub-micron imaging with industry-leading resolution and contrast of intact samples.
Highlights
Extending the Limits of Micro- and Nano-CT Solutions
- High resolution across a comprehensive range of sample types, sizes and working distances
- Advanced flux and faster scans without compromising resolution
- Fast Acquisition Scanning Technology (FAST™) for continuous motion scanning for 3D navigation for sub 1-minute whole sample data collection times
- Volume Scout™ for true 3D navigation
- Breakthrough resolution performance for VersaXRM 730 takes accessibility to the next level with resolution of 450-500 nm across the full range of source voltage, from 30 kV to 160 kV
- ZEISS DeepRecon Pro™ with AI-based reconstruction technology for up to 10× throughput or superior image quality on unique, semi-repetitive, and repetitive sample workflows, now included
- Deep learning for resolution and throughput at full field of view for reconstruction
- In situ imaging for non-destructive characterization of microstructures overtime in controlled environments
- Investment protection with upgradeability and extendibility to future innovations and improvements
Highest Resolution and Flux
ZEISS VersaXRM use a combination of novel two-stage magnification optics and a high flux X-ray source to provide faster sub-micron scale resolution images, whereas standard tomography depends on single-stage geometric magnification.
The Resolution at a Distance (RaaD™) architecture allows for high-resolution 3D imaging of larger, denser objects, such as components, precious samples like meteorites, and electronics that are still intact, as well as life science specimens. Quick scans of very big samples (up to 25 kg) are possible with the optional flat panel extension (FPX), which allows navigation to interior regions of interest.
New Degrees of Freedom
For sophisticated scientific and industrial research, users can employ the industry’s most comprehensive 3D X-ray imaging solution: to get an unprecedented characterization of materials and their properties, maximize absorption and phase contrast. Diffraction Contrast Tomography can reveal 3D crystallographic information.
With sophisticated acquisition techniques, users can improve the speed and precision of scanning big or irregular samples. Utilize machine-learning methods to assist with sample post-processing and segmentation.
Premier 4D/In Situ Solution
The ZEISS VersaXRM Series can describe the 3D microstructure of materials non-destructively in situ (under controlled conditions) and track the evolution of structures over time (4D).
ZEISS VersaXRM retain the best resolution across vast working distances thanks to Resolution at a Distance, which allows it to accommodate both sample, environmental chamber and high precision in-situ load rigs without reducing resolution. To handle multi-scale correlative imaging issues, the Versa works in tandem with other ZEISS microscopes.
Award-winning Guidance and Control System
The ZEN navx® guidance and control system is based on human-centered design principles, factoring in user habits, biases, and workarounds to deliver an easy-to-use interface that enables immediate success for novice users and an expanded capability for experienced users. Awarded the RedDot Best of the Best Interface award, enables users to automate their workflows and provides instant guidance on the impact the parameters chosen.