The ZEISS Xradia 515 Versa offers exceptional versatility for both scientific discovery and industrial research, with enhanced non-destructive microtomography capabilities. Xradia 515 Versa features ZEISS’ renowned Resolution at a Distance (RaaD) technology, ensuring high resolution at longer working distances. With advanced contrast, 4D and in situ capabilities, and support for a wide range of sample sizes and types, the flexible Xradia 515 Versa delivers powerful performance and faster time to results for any lab.
Features
- Streamlined experiment setup with the Scout-and-Scan workflow interface
- Achieve 500 nm spatial resolution and reach voxel sizes down to 40 nm when using the optional 40× objective
- Dual-stage magnification system engineered with optics comparable to synchrotron instruments
- SmartShield technology protects both your samples and the microscope during operation
- Rigid, stable platform designed to deliver consistent top-tier imaging performance
- Add the Flat Panel Extension (FPX) to capture significantly larger fields of view
- Enhance results with the Advanced Reconstruction Toolbox, available as an upgrade
- Expand capabilities with optional accessories, including:
- Autoloader robotic sampler for automated handling of up to 14 samples
- In Situ Interface Kit to support in situ and 4D imaging experiments