ZEISS Xradia Context microCT

The ZEISS Xradia Context is a non-destructive 3D X-Ray micro-computed tomography instrument with a broad field of view. Users can photograph tall, heavy (25 kg) and large samples in their complete 3D environment, as well as tiny samples with excellent resolution and detail, using a powerful stage and adjustable software-controlled source/detector configuration.

  • Use non-destructive failure analysis to find internal flaws in user sample or workpiece without having to cut it
  • Connect to the ZEISS correlative microscopy environment and use nondestructive 3D imaging to find regions of interest for high-resolution 2D or 3D electron microscopy imaging
  • Porosity, fractures, inclusions, flaws and various phases are examples of performance-defining heterogeneities in complex materials that can be characterized and quantified
  • Get 3D data on whole electrical components, massive raw materials samples or biological specimens
  • Ex situ or in situ sample modifications are used to conduct 4D evolutionary investigations


Full Context 3D Imaging

  • With tiny samples, increase geometric magnification to locate and describe micron-scale features with excellent contrast and clarity
  • With picture quality, users may go up to 10X quicker
  • Quickly mount and align the specimens, or upgrade to an Autoloader for automated specimen collection and continuous scanning of up to 14 samples
  • With a high pixel density detector of six megapixels, users can resolve small details in their complete 3D context, even in a rather large image volume
  • Benefit from a simplified collection approach that allows for quick exposure periods and data restoration

Virtual cutaway view of the interior of an intact catalytic converter.

Virtual cutaway view of the interior of an intact catalytic converter. Image Credit: Carl Zeiss Microscopy GmbH

Based on the Proven Xradia Platform

  • Take advantage of a system designed to ensure stability, as well as developments in high-resolution, high-quality data capture and reconstruction
  • Conduct 4D experiments to determine how the microstructure of materials varies under different situations
  • The Scout-and-Scan control system is simple to use and provides an effective working environment
  • As it is based on the same technology as the Xradia Versa series, the Xradia context microCT benefits from years of research

3D rendering and clipping plane of a composite sample with carbon and glass fibers.

3D rendering and clipping plane of a composite sample with carbon and glass fibers. Image Credit: Carl Zeiss Microscopy GmbH

Convertible to X-Ray Microscopy (XRM)

  • This enables users to use 3D tomographic imaging that can scale to meet user needs. The only microCT that can be converted to a ZEISS Xradia 5XX Versa 3D X-Ray microscope at any time is the Xradia Context microCT (XRM)
  • For more flexibility and performance in spatial resolution, improved contrast and acquisition methods, add FPX (flat panel extension)
  • To examine material evolution in 4D, use the in situ Interface Kit and load stages
  • Users’ imaging instruments should grow in parallel with customer needs: Xradia Context is now part of the ZEISS X-Ray imaging portfolio, allowing ZEISS to continue to expand the capabilities and usefulness of its field systems

Full field of view imaging of a bear jaw.

Full field of view imaging of a bear jaw. Image Credit: Carl Zeiss Microscopy GmbH

Other Equipment by this Supplier

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