ZEISS Xradia 510 Versa 3D X-ray microscope (XRM) is a 3D submicron imaging system that provides breakthrough flexibility. Users can now achieve new levels of discovery with the industry's premier in situ/4D solution.
ZEISS’ unique resolution at a distance (RaaD) capability breaks the one micron resolution barrier for samples ranging from mm to cm. The instrument provides a powerful combination of contrast and resolution with flexible working distances to extend the power of non-destructive imaging in laboratories.
True Submicron Spatial Resolution at Millimeters to Inches from Source
The Xradia 510 Versa maximizes the power of XRM for flexible 3D imaging in various research environments. It achieves better than 0.7 μm true spatial resolution with minimum achievable voxel size below 70 nm. Users can now experience increased versatility for soft tissues or low Z materials with sophisticated absorption contrast together with novel phase contrast to address the limitations inherent in conventional computed tomography.
With the Xradia 510 Versa, users can achieve performance beyond micro-CT and extend scientific research beyond the limits of flat-panel systems. Unlike conventional tomography that relies on a single stage of geometric magnification, Xradia Versa microscopes include a unique two-stage process based on synchrotron-caliber optics with a detection system resolution optimized for contrast, resolution, contrast and high resolution at large working distances.
With breakthrough ZEISS resolution at a distance (RaaD), users can achieve unparalleled lab-based exploration for different types of samples and applications.
Thanks to non-destructive X-ray and flexible multilength scale capabilities, users can image the same sample across a wide range of magnifications. With the Xradia Versa, they can study the evolution of properties over time and characterize the microstructure of materials in their native environments.
The optional Versa In Situ Kit can be used to optimize set-up; makes operation easy, offers a faster time to results, and organizes the facilities that support in situ rigs (such as plumbing and wiring) to enable ease of use and maximum imaging performance. In addition, an efficient workflow environment with recipe-based set-up is enabled by the Scout-and-Scan control system which makes the Xradia 510 Versa easy for users with different levels of experience.
The Xradia Versa architecture employs a two-stage magnification method that allows users to achieve RaaD. In the first stage, sample images are enlarged through geometric magnification as with traditional micro-CT.
In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Xradia Versa instruments maintain submicron resolution at large working distances, thanks to reducing reliance on geometric magnification.
This allows users to effectively study the broadest range of sample sizes, including within in situ chambers. The benefits achieved by the core architecture of the system are further extended by a range of optional features.
- Achieve the highest resolution at the largest working distance from the source, a prerequisite for in situ and large sample imaging, with the advanced Versa microscope design
- Preserve and extend the use of valuable samples with non-destructive 3D imaging
- Industry-leading 4D and in situ capabilities support a range of in situ rigs for submicron imaging of practical sized samples (mm to inches), with sample size up to 300 mm and weight capability up to 25 kg
- Multi-length scale imaging of the same sample across a broad range of magnifications, <0.7 µm true spatial resolution and below 70 nm voxel size
- The combination of unique architecture and dual stage magnification allows continuous operation via automated multiple point tomography and repetitive scanning; easy navigation through multiple magnification detector system; and high speed reconstruction
- Autoloader option enables users to program and run up to 14 samples at a time to maximize productivity, and automate workflows for high volume scanning
- Advanced absorption and phase contrast for soft tissue and low Z materials
- Scout-and-Scan™ control system for simple and easy workflow set-up ideal in multi-user environments
- Minimal need for sample preparation
- Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as plumbing and wiring) to ease set-up and allow maximum imaging performance
ZEISS Xradia 510 Versa 3D X-ray Microscope
Porous Polymer with Fluid Flow
Package on Package Assembly
Shale with Pore Connectivity