This article focuses on profile roughness parameters and their significance in characterizing the surface morphology of machined surfaces.
By Samudrapom Dam
13 May 2022
Near-field infrared spectroscopy is a vital analysis method that is extensively utilized in materials science, biological sciences as well as optical studies.
By Ibtisam Abbasi
12 May 2022
Through a variety of creative products and tools, the digital technology of the industry generates new opportunities for more favorable operating setups.
By Ibtisam Abbasi
11 May 2022
The sample preparation before conducting an infrared spectroscopy (IR) study is as critical as the study itself, and the samples which are difficult to dissolve in any IR-transparent solvent are mixed with potassium bromide (KBr).
By Bhavna Kaveti
10 May 2022
Semiconductors, often known as computer microchips or integrated circuits (ICs), are an integral part of digital equipment from computers to household appliances to diagnostic instruments and military systems.
By Ibtisam Abbasi
9 May 2022
From the middle of the twentieth century onwards, the world economy has been undergoing what academics refer to as the “digital transition.” This is the shift of one industry after another toward computer-based ways of working, which is now all but ubiquitous.
By Ben Pilkington
6 May 2022
Atomic force microscopy (AFM) is an effective technique for evaluating microscopic surface topography and material parameters of any specimen. AFM microscopes are available in different sizes and modes of operation, each with its advantages and limitations.
By Ibtisam Abbasi
5 May 2022
This article will look at the use of these resins in additive manufacturing, and recent research into improving their isotropic properties to manufacture materials with enhanced temperature and strain detecting abilities.
By Reginald Davey
4 May 2022
Physical evidence may be identified and compared using laser ablation inductively coupled plasma mass spectroscopy (LA-ICP-MS), which can distinguish elemental and isotope variations down to the part per billion (ppb) level.
By Ibtisam Abbasi
3 May 2022
This article focuses on the use of electron microscopy paired with fast Fourier transform (FFT-EM), its advantages and limitations, alternative methods, and recent studies involving this method.
By Samudrapom Dam
2 May 2022