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Sub-One Technology – Smooth, Hard Coatings for Internal Surfaces and Cavities

Pattern Recognition System for Flaw Identification in Semiconductor Wafers from NextTechs Technologies

Interferometric Moduator for Optical Signal Processing from NextTechs Technologies

Tinius Olsen – Materials Testing Machines and Equipment

Tinius Olsen – Materials Testing Machines and Equipment

Tensile Stress Stage for Microscopes Allows Real Time Observation of Materials

ISS Group Offer Thermo Scientific Microanalysis Solution - News Item

MRS International Materials Research Conference

Materials Research Society - MRS 2008 Spring Meeting

Particle Size and Shape Analysis of Abrasive Grains

Particle Size and Shape Analysis of Abrasive Grains

Rheology of Thermoplastic Melts-Determination of Rheological Properties Using Rotational and Capillary Rheometers

Rheology of Thermoplastic Melts-Determination of Rheological Properties Using Rotational and Capillary Rheometers

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