Materials Science News

RSS

Combining Raman Microscopy with Scanning Electron Microscopy (SEM) To Study Inorganic And Mineral Samples At The Geological Institute Of Romania, Bucharest.

The Geological Institute of Romania, located in Bucharest, was founded in 1906. It is famous for its museum which hosts a collection of more than 80,000 samples of rocks, fossils and minerals from all over Romania.

From Renishaw plc - Spectroscopy 13 Jan 2017

Techsil Launch New Range of Water-based Adhesives for Vehicle Flooring and Interiors

Vehicle manufacturers are investigating using lightweight materials as one approach to reducing emissions. Plastics and reinforced composites are increasingly being used to make components throughout the vehicle but the bonding difficulties associated with these materials can cause a real headache for manufacturers. Traditional mechanical fasteners have the disadvantage of adding weight so engineers have been turning to adhesives to join these substrates together. However, one drawback is that the adhesives needed to provide a strong reliable bond to plastics are solvent-based and these solvents pose real hazards to humans and the environment making them less welcome in manufacturing.

13 Jan 2017

Lucifer Furnaces HS8 Series for High Speed Steel Heat Treating

Lucifer Furnaces, Inc. has designed a delivered a dual chamber furnace ideal for heat treating high speed steels. The HS8 Series, built with rugged 12-gauge sheet steel and reinforced throughout, heats to 2450°F in the upper chamber with silicon carbide heating elements mounted across the roof and below the hearth. Elements are a solid bar type with termination connections for easy service via removable covers on both sides of the furnace.

13 Jan 2017

BWID and BWIQ Software Receive Updates

B&W Tek, a mobile spectroscopy solutions company that delivers lab quality Raman, LIBS, UV-Vis and NIR solutions through userfriendly mobile platforms, is excited to announce updates to their intuitive BWIDÂ® and BWIQÂ® software.

From B&W Tek 13 Jan 2017

MANTA Instruments selects HORIBA Instruments, Inc. to act as the Americas Distributor for Breakthrough Nanoparticle Tracking Analyzer

The ViewSizerTM 3000 implements improvements to particle tracking technology, including proprietary illumination and detection methods.

13 Jan 2017

Researchers Use Electric Field to Develop Magnetic Properties in Nonmagnetic Material

Researchers drew magnetic squares in a nonmagnetic material with an electrified pen in a proof-of-concept study featured in Nature Physics. This magnetic doodle was then read with X-rays.

12 Jan 2017

Biomedical Engineers Use Nature’s Weaving Formula to Mimic Complex Properties of Ingenious Materials

For the first time, UNSW biomedical engineers have woven a 'smart' fabric that mimics the sophisticated and complex properties of one nature's ingenious materials, the bone tissue periosteum.

12 Jan 2017

New Light-Activated Antimicrobial Material Helps Fight Against Common Hospital Infections

Researchers at the Universitat Jaume I (UJI) in Castellón, Spain, have developed a new light-activated antimicrobial material for use in the fight against the most common hospital infections.

12 Jan 2017

Morgan Advanced Materials Opens Indian Office to Meet Increased Demand

In a move to make the most of growing opportunities in India for electrical carbon, machined carbon/graphite and silicon carbide products in a range of industries, Morgan Advanced Materials, a world leader in materials science, has opened a new office in India.

12 Jan 2017

Yokogawa Launches Higher-Performance Successor to Market-Leading AQ6315A Wideband Optical Spectrum Analyser:

The new AQ6374 is the successor to the Yokogawa and ANDO-branded market-leading AQ6315A wideband optical spectrum analyser. Featuring diffraction grating based monochromator technology delivering high-precision measurement performance and accuracy, an enhanced user interface and an air purging feature, the new instrument offers engineers a powerful benchtop tool for general-purpose optical spectrum measurements over the wavelength range from 350 to 1750 nm.

12 Jan 2017

Versatile Laboratory Sample Sealer

Porvair Sciences announces the introduction of Autocapper - a versatile electronic applicator that enables friction sample seals to be quickly and securely applied to both microplates and microtube racks.

12 Jan 2017

New Chemical Process White Paper: Risks From Rising Temperature in Scale-up

A new white paper discusses how to assess the implications of changing temperature regimes under which chemical reactions are carried out. Examples from both the lab and pilot plant are presented. METTLER TOLEDO has a...

12 Jan 2017

Onefive Releases a New 100W Picosecond Laser Genki â€“ 10 XP for Advanced Material Processing

Onefive GmbH releases the new Genki â€“ 10 XP picosecond laser featuring 100W output power in a new, compact package, for optimal and cost-effective workstation integration.

12 Jan 2017

STMicroelectronics Advances Single-Chip Telematics/Connectivity Processors to Support Future Connected-Driving Services

STMicroelectronics (NYSE: STM), a global semiconductor leader serving customers across the spectrum of electronics applications, has boosted performance and security in its latest Telemaco processors tailored to support richer connected-driving services.

12 Jan 2017

Methods 3D Introduces 3D Systems' ProxÂ® Sls 500 Production Ready 3D Printer

Methods 3D Inc., a subsidiary of Methods Machine Tools Inc. featuring innovative industrial production grade 3D printing solutions, has introduced the 3D Systems' ProXÂ® SLS 500 Selective Laser Sintering production 3D printer featuring fast speeds, high print resolution and an extensive range of engineered composite materials. The ProX SLS 500 delivers superior parts with high precision, durability and quality, all in a compact production-grade system.

12 Jan 2017

Materials Science News

Combining Raman Microscopy with Scanning Electron Microscopy (SEM) To Study Inorganic And Mineral Samples At The Geological Institute Of Romania, Bucharest.

Techsil Launch New Range of Water-based Adhesives for Vehicle Flooring and Interiors

Lucifer Furnaces HS8 Series for High Speed Steel Heat Treating

BWID and BWIQ Software Receive Updates

MANTA Instruments selects HORIBA Instruments, Inc. to act as the Americas Distributor for Breakthrough Nanoparticle Tracking Analyzer

Researchers Use Electric Field to Develop Magnetic Properties in Nonmagnetic Material

Biomedical Engineers Use Nature’s Weaving Formula to Mimic Complex Properties of Ingenious Materials

New Light-Activated Antimicrobial Material Helps Fight Against Common Hospital Infections

Morgan Advanced Materials Opens Indian Office to Meet Increased Demand

Yokogawa Launches Higher-Performance Successor to Market-Leading AQ6315A Wideband Optical Spectrum Analyser:

Versatile Laboratory Sample Sealer

New Chemical Process White Paper: Risks From Rising Temperature in Scale-up

Onefive Releases a New 100W Picosecond Laser Genki â€“ 10 XP for Advanced Material Processing

STMicroelectronics Advances Single-Chip Telematics/Connectivity Processors to Support Future Connected-Driving Services

Methods 3D Introduces 3D Systems' ProxÂ® Sls 500 Production Ready 3D Printer

News Categories

Understanding New Tools for Microplastics and Particle Analysis

Polymer Upcycling via Reactive Extrusion: FTIR Microscopy Unlocks Blend Compatibilization Insights

Precision Carbon Capture Monitoring for Net Zero Goals

Our Latest eBook

eBook: UV/Vis workbook for aspiring scientists

Unigraph 9000™: A Graphite Thermal Interface Material (0.032 mm)

TrueMatch - Raman Spectral Database Management Software

The VERTEX NEO Ultra: The New Gold Standard for Benchtop FT-IR Spectrometers

Editorial Highlights

How Floquet Engineering Can Control Material Properties

What Makes a Material Smart? The Science Behind Responsive Polymers

Mycelium: How Fungi Turns Agricultural Waste to Advanced Materials

Sponsored Content

Boost the Reliability of Performance Polymers in High-Pressure Environments

How to Interpret Fineness of Grind Using Scratch and Bulk Analysis Methods

Mapping Semiconductor Defects Using Photo Induced Force Microscopy (PiFM)

Analyzing Photocleavage Events with Time-Resolved Emission Spectroscopy