Exposing silicon wafers to light during chip manufacture requires special fixtures called chucks. Novel electrostatic chucks made of glass ceramics are incredibly flat. This prevents structural distortions on the exposur...
Dynamic Structures and Materials (DSM) has expanded its portfolio of customizable FlexFrame PiezoActuators™.
DSM's FlexFrame PiezoActuator™ product family can be custom-configured for unique geometric...
Many hopes are pinned on spintronics. In the future it could replace electronics, which in the race to produce increasingly rapid computer components, must at sometime reach its limits. Different from electronics, where ...
The EUREKA E! 3734 i-StARS project is developing a compact, fully integrated and low-cost start-stop system for cars to replace conventional alternators in mass production. This second-generation starter alternator rever...
In a recent paper, researchers at
the National Institute of Standards
and Technology (NIST) described a new method for creating gas detectors
so sensitive that some day they may be able to register these tiny emissions
from a single cell.
While exploring the properties of polymer formation, a team of scientists
at the National Institute for
Standards and Technology (NIST) has made a fundamental discovery about
these materials that could improve methods of creating the stable crystalline
films that are widely used in electronics applications-and also offer insight
into a range of other phenomena.
Metallic carbon nanotubes have been proposed as interconnects in future electronic
devices packed with high-density nanoscale circuits.
Nanoscale electronic devices have the potential to achieve exquisite sensitivity as sensors for the direct detection of molecular interactions, thereby decreasing diagnostics costs and enabling previously impossible sens...
E-beam supplier Vistec, along with semiconductor research group CEA/Leti, and emerging design and software company D2S, today announced a collaboration focused on refining and validating advanced design-for-e-beam (DFEB)...
A joint team of researchers at CIC nanoGUNE (San Sebastian, Spain) and the
Max
Planck Institutes of Biochemistry and Plasma Physics (Munich, Germany) report
the non-invasive and nanoscale resolved infrared mapping of strain fields in
semiconductors.
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