Posted in | Electronics

Keithley to Supply Multiple Parametric Test Systems to X-FAB

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, today announced it had received orders for additional S530 Parametric Test Systems from X-FAB Silicon Foundries. X-FAB, a Germany-based foundry for analog/mixed-signal devices and micro electro-mechanical systems (MEMS), ordered low power versions of the S530 tester for installation on the main production line at its facility in Kuching, Malaysia, where high voltage S530 systems are already in place.

Dr. Manfred Riemer, the chief operating officer at X-FAB, said, “The strategic cooperation and excellent support our management teams have enjoyed through working with Keithley personnel made the decision an easy one. The compatibility of the S530 systems with X-FAB’s manufacturing automation systems and the high correlation with our existing test equipment have been excellent.”

Steffen Richter, X-FAB’s group manager for process control monitoring, will present a paper on the joint X-FAB/Keithley effort involving the initial S530 correlation and speed optimization project at the 16th European Manufacturing Test Conference (EMTC), to be held during SEMICON® Europa 2014 in Grenoble, France, October 7–9, 2014. The paper, “Optimizing Automatic Parametric Test (APT) in Mixed Signal/MEMS Foundry,” is co-authored with Alex Pronin, Ph.D., a lead applications engineer at Keithley.

X-FAB has relied on Keithley parametric test systems for many years. Based on their experience with our S530 high voltage systems, X-FAB decided to add Keithley low power systems to their main production line.

Keithley general manager Mike Flaherty

Flaherty continued, “Keithley’s personnel worked closely with the engineering teams to ensure the results correlated well with those from their existing testers. Our applications team converted thousands of lines of original test system code and then performed correlation tests, matching more than 1200 parameters to within 3 percent of the original vendor’s data.”

Keithley S530 Parametric Test Systems provide an exceptional low cost of ownership, mainly for semiconductor fabs requiring high throughput testing across a broad mix of products or wherever wide application flexibility and fast test plan development are critical. The low power (200V) system configuration is typically used for standard CMOS, bipolar, MEMS, and other relatively low voltage semiconductor processes. The high power (1kV) version is optimized for the difficult breakdown and leakage tests that GaN, SiC, and Si LDMOS power devices demand.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Keithley Instruments - Electronic Instruments. (2019, February 08). Keithley to Supply Multiple Parametric Test Systems to X-FAB. AZoM. Retrieved on October 20, 2019 from https://www.azom.com/news.aspx?newsID=42493.

  • MLA

    Keithley Instruments - Electronic Instruments. "Keithley to Supply Multiple Parametric Test Systems to X-FAB". AZoM. 20 October 2019. <https://www.azom.com/news.aspx?newsID=42493>.

  • Chicago

    Keithley Instruments - Electronic Instruments. "Keithley to Supply Multiple Parametric Test Systems to X-FAB". AZoM. https://www.azom.com/news.aspx?newsID=42493. (accessed October 20, 2019).

  • Harvard

    Keithley Instruments - Electronic Instruments. 2019. Keithley to Supply Multiple Parametric Test Systems to X-FAB. AZoM, viewed 20 October 2019, https://www.azom.com/news.aspx?newsID=42493.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit