PANalytical, the world’s leading supplier of analytical instrumentation and software for X-ray and related techniques, announces their free webinar entitled ‘Do you want to collect high-quality X-ray reflectometry data? Good practices that will help’ organized on 15 December 2016, presented by Dr. Zhaohui Bao, XRD Application Specialist, PANalytical B.V., the Netherlands.
X-ray reflectometry (XRR) is a well-established analytical method for the characterization of thin layered structures, surfaces and interfaces. It is used to determine layer thicknesses and densities and provides roughness-related information. The basics of XRR and the analysis of XRR data were discussed in one of PANalytical’s webinars last year. This time, the focus will be on a typical workflow, from setting up the X-ray optics of a diffractometer, the essential steps of the sample alignment procedures to the final XRR measurement.
Don’t miss the useful practices and tips that we will share with you in this webinar. They will help you to collect high-quality XRR data from your layered samples.
- Title: Do you want to collect high-quality X-ray reflectometry data? Good practices that will help
- Date: 15 December 2016
- Time: 10:00 AM EDT (4:00 PM CET)
- Duration: 60 minutes
- Presenters: Dr. Zhaohui Bao
Click here to register.
For more information on PANalytical’ scheduled webinars see www.panalytical.com/webinars