CSMA has renewed a contract working with the European Space Agency (ESA).
CSMA provides expertise, consultancy and analytical services in the areas of determining causes and reducing effects of laser-induced damage and laser-induced contamination.
Critical optical components have been analysed to help identify contamination and investigate damage.
A range of techniques, backed by specialist scientific expertise, have been employed to investigate uniquely subtle defects:
• ULESIMS (Ultra Low Energy Secondary Ion Mass Spectrometry)
• SNMS (Sputtered Neutral Mass Spectrometry) and
• TEM (Transmission Electron Microscopy)
are used in combination to interrogate the surface and the near surface of the coated components.
ULESIMS gives elemental information with depth of a very high resolution and is ideal for monitoring species with depth.
SNMS gives quantified elemental information, with depth, without the need for standards.
TEM, with FIB (Focused Ion Beam) sample preparation, can be used to produce high-resolution images of thin films to look at the composition, structure and give crystallographic information.