Bridge the Gap in Lab-Based Non-Destructive Submicron Microscopy
ZEISS Xradia 410 Versa is a powerful, cost-efficient "workhorse" solution designed for 3D submicron imaging. It bridges the gap between less powerful computed tomography (CT) systems and high-performing X-ray microscopes.
The instrument delivers non-destructive 3D imaging with excellent contrast, resolution, contrast, and in situ capabilities. It allows users to perform pioneering research for the broadest range of sample sizes, and improve imaging workflows in various lab environments.
Highlights
Industry-leading 4D and In Situ Capabilities for Flexible Sample Sizes and Types
The Xradia 410 Versa X-ray microscope delivers flexible and cost-efficient 3D imaging, enabling users to address a variety of samples and research environments. Non-destructive X-ray imaging maintains and extends the use of valuable samples over time. The system achieves 0.9 µm true spatial resolution with minimum achievable voxel size of 100 nm.
With sophisticated absorption and phase contrast for soft or low-Z materials, users are provided with more versatility to resolve the limitations of conventional computed tomography (CT) approaches.
The Xradia Versa instruments extend scientific research beyond the limits of projection-based micro- and nano-CT systems. The Xradia 410 Versa includes a unique two-stage process based on synchrotron-caliber optics, unlike conventional tomography that relies on a single stage of geometric magnification. The instrument is user-friendly and delivers flexible contrast.
ZEISS’ breakthrough resolution at a distance (RaaD) allows users to maintain submicron resolution across a broad spectrum of sample dimensions within a range of in situ rigs and native environments.
Due to non-destructive multi-length scale capabilities, users can image the same sample across a wide range of magnifications. This makes it possible to characterize the evolution of material microstructure properties as they are subjected to simulated environmental conditions (in situ), or between sequential treatments (4D).
The Scout-and-Scan control system allows an efficient workflow environment with recipe-based set-up that makes the Xradia 410 Versa easy for users having different levels of experience.
Benefits
A two-stage magnification technique is used by Xradia Versa architecture enabling users to achieve resolution at a distance (RaaD). Sample images can be enlarged via geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then magnified optically.
Due to reducing dependence on geometric magnification, Xradia Versa instruments maintain submicron resolution at large working distances. This allows users to explore the broadest range of sample sizes effectively, including within in situ chambers.
- High spatial resolution down to <0.9 µm and voxel size to 100 nm
- Non-destructive 3D imaging to preserve and extend the use of valuable samples
- Sophisticated contrast solutions for soft tissue and low Z materials
- Scout-and-Scan™ control system for simple and easy workflow set-up, suitable in multi-user environments
- Advanced in situ and 4D capabilities for flexible sample sizes and types
- Minimal need for sample preparation
- Heavy load sample stage and extended source and detector stage travel
- Easy navigation via multiple magnification detector system
- High speed reconstruction
- Continuous operation through automated multiple point tomography and repetitive scanning
- High speed reconstruction
- Autoloader option allows users to program and run up to 14 samples at a time to increase productivity, and automate workflows for high volume scanning
- Optional Versa In Situ Kit organizes the facilities that support environmental chambers, such as plumbing and wiring, to ease set-up and facilitate maximum imaging performance while delivering the highest 3D resolution for in situ applications
ZEISS Xradia 410 Versa 3D X-ray Microscope
Intact Electronics Package