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Automated Loading System For SEM-Based Minerals Analyser Introduced By TESCAN

AXT Pty Ltd, TESCAN’s agent in Australia and New Zealand are excited to announce that they have recently added an automated sample loading accessory for the TESCAN Integrated Minerals Analyzer or TIMA system. The TIMA is a Scanning Electron Microscope tool, designed specifically for the rapid analysis of rocks, ores, concentrates, tailings, leach residues or smelter products and other geological samples.

From AXT Pty Ltd 15 Jan 2014

Software Upgrade For S530 Parametric Test System

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, introduced today the latest upgrades to its popular S530 Parametric Test Systems, the semiconductor industry’s most co...

From Keithley Instruments - Electronic Instruments 15 Jan 2014

imec Celebrates 30th Anniversary

World-leading nanotechnology research and development center imec, today announced the celebration of its 30th anniversary. Founded in 1984 as a non-profit organization, imec has grown to be a multi-disciplinary expertise center in the fields of semiconductor chips and systems, electronics for life sciences, body area networks, energy, photovoltaics, sustainable wireless communication, image sensors and vision systems, and flexible electronics and displays.

From IMEC 15 Jan 2014

XSOL to Distribute Yingli Green Energy’s PV Modules in Japan

Yingli Green Energy Holding Company Limited ("Yingli Green Energy" or the "Company"), the largest vertically integrated photovoltaic ("PV") module manufacturer in the world, known as "Yingli Solar", today announced that its wholly-owned subsidiary, Yingli Green Energy Japan Corporation Ltd. ("Yingli Japan") has entered into a distribution agreement with XSOL Co., Ltd.("XSOL"), a leading Japanese solar energy company and full-service PV system provider.

15 Jan 2014

Global e-Beam Wafer Inspection System Market Forecast to Grow at 25.9% CAGR for the Period 2013-2018

Research and Markets has announced the addition of the "Global e-Beam Wafer Inspection System Market 2014-2018" report to their offering.

From Research and Markets 15 Jan 2014

New Modeling Solution to Assess Cost of Advanced Semiconductor Technology Options

Nanoelectronics research center imec and AlixPartners, a leading global business advisory firm, announced today that the two companies are co-developing a cost modeling solution to assess the cost of advanced semiconductor technology options. The work is aimed at assisting the semiconductor industry in improving the operational intelligence around costs of future technology nodes.

From IMEC 15 Jan 2014

Bruker Launch Dektak XTL Stylus Profiler for Semiconductor Samples up to 300mm

Bruker (NASDAQ: BRKR) today announced the release of the Dektak XTL Stylus Profiler, extending its industry-leading stylus profilometry capabilities to 200 and 300 millimeter semiconductor wafer fabs and next-generation touch panel manufacturers.

From Bruker Nano Surfaces and Metrology 14 Jan 2014

Denise Stanislawczyk, Operations Manager at ABB to Receive Women in Manufacturing STEP Award

The Manufacturing Institute, an affiliate of the National Association of Manufacturers, announced that they will honor ABB’s Denise Stanislawczyk with the prestigious Women in Manufacturing STEP (Science, Technology, Engineering and Production) Award next month in Washington, DC.

From ABB Measurement and Analytics Analytical Products 14 Jan 2014

E2S Launch High-performance Alarm Horn Sounders with Aluminium Enclosures

E2S has launched high-performance, intrinsically safe alarm horn sounders and combination devices with aluminium enclosures.

14 Jan 2014

Cortec Releases New Shrink Films Brochure

This latest Cortec® brochure highlights our Vapor phase Corrosion Inhibitor (VpCI®) Shrink Films; the most advanced corrosion inhibiting shrink films available on the market today. Cortec® films are trusted globally for transit and equipment preservation.

From Cortec Corporation 14 Jan 2014

Analytik Launch Handheld GL Optic SPECTIS 5.0 touch Spectrometer for Lab-Grade Analysis in a Compact Format

Analytik, leading suppliers of innovative analytical instrumentation to the UK and Ireland, partner with German company, GL Optic, for the supply of handheld and laboratory-based spectroradiometers and integrating spheres for use in both quality control and research applications for the growing lighting marketplace.

From Analytik Ltd 14 Jan 2014

Precision Glass Optics Announces Range of Industrial Optical Thin Film Coatings

Precision Glass & Optics (PG&O), global experts in optical manufacturing, customized optical solutions, and precision thin film coatings, announces a line of precision optical thin film coatings for industrial ap...

From Precision Glass & Optics 14 Jan 2014

Seal Analytical Discuss Comparisons between Discrete and Continuous Flow Analysis

A wide variety of factors affect the choice of analytical instrument. These include target workload (samples/hour), variety of chemistries, methods required, bench space, staff availability etc. In the following article Lalicia Potter, Technical Sales & Support Director at SEAL Analytical, examines one of the common decisions facing laboratory managers.

From SEAL Analytical Ltd. 13 Jan 2014

INEL Announce 5th Edition of Combined X-Ray and Neutron Scattering Analysis Workshop

INEL, a French company specializing for 40 years in X-ray diffraction instrument design and manufacturing, joins the IUT of Caen for the 5th consecutive year to organize the 5th workshop "Combined Analysis Using X-r...

13 Jan 2014

Micromeritics Launches New 3Flex - Innovative, Versatile High-Resolution Surface Characterization Analyzer

Micromeritics 3Flex Surface Characterization Analyzer is a fully automated, three-station instrument capable of high-performance physisorption, mesopore, micropore, and chemisorption analyses with superior accuracy, resolution, and data reduction.

From Micromeritics Instrument Corporation 13 Jan 2014