Posted in | Materials Testing and Characterisation

Grazing Incidence X-ray Diffraction with the Aeris Diffractometer

Grazing incidence X-ray diffraction (GIXRD) analysis is usually performed on thin film samples. To perform Grazing incidence diffraction on a compact X-ray diffractometer like Malvern Panalytical's Aeris, you need a parallel beam set-up. Nicholas Norberg demonstrates exactly how this works. The quality of the data proves that Aeris is your partner for studying polycrystalline coatings, whether you need detailed studies of crystalline phases, or rapid high throughput quality control.

Run time: 9:21min

Grazing Incidence X-ray diffraction with the Aeris diffractometer

Video Credit: Malvern Panalytical

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