Posted in | Materials Testing and Characterisation | Pittcon 2011 Interviews

Benchtop XRF - Shimadzu EDX-LE X-Ray Fluorescence System

Dan Davis from Shimadzu shows us their EDX-LE benchtop x-ray fluorescence (XRF) instrument. he shows us key features such as the sample positioning camera and runs a sample in real time for us.

The EDX-LE can rsolve elements from aluminum to uranaium at levels from sigle digit ppm levels through to percantage levels, with results being generated in just a few minutes. It is well suited to applications like RoHS detection amongst others.

It is able to measure surface composition, and penetrates slightly below the surface and can be easily operated even by a novice user.

Run time - 3:11min

EDX-LE Benchtop XRF System from Shimadzu

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